APJEE 2022: Application Form(out), Exam Date, Exam Pattern, Eligibility Criteria
APJEE 2022 application form has been released on 19th April 2022. The ‘Arunachal Pradesh State Council for Technical Education’ (APSCTE) … Read more
Here we provide complete information and alerts on Entrance Exams 2021 in India. Students can check all the latest entrance exam updates and other associated details. 99entranceexam.in is one of the leading and reputed Portals on Entrance Examinations, Admission alerts and career information which assists students to make decisions about their career. Over here a detailed list of entrance exams for medical, engineering, law, MBA and many other educational fields is listed here. Depending upon your area of interest, you can check out the details of numerous competitive exams in India. It is the perfect destination which caters to all your Higher Education requirements.
The entrance exams 2021 section includes details on various competitive exams such as KEE 2021, CIPET JEE 2021, UCEED 2021, AICE, VEE 2021, MICAT, BEEE 2021, PMUET 2021, JEE Main and JEE Advanced, JNTU PACET, NEST 2021, TNEA 2021, IRMA, AP PGECET 2021, IIT JAM 2021, KEAM 2021, SNAP 2021, RPCET 2021, PU CET UG 2021, KCET 2021, IUET, MAH MCA CET, UPSEE 2021, ASSAM CEE, XAT, MBA CET, ATMA, COMEDK 2021, BITSAT 2021, HARYANA DET and many other reputed exams in India.
APJEE 2022 application form has been released on 19th April 2022. The ‘Arunachal Pradesh State Council for Technical Education’ (APSCTE) … Read more
APJEE 2022 application form is available from 19th April 2022 and the deadline for submission of application is 15th June … Read more
The application form for CUCET exam has been released on 6th April 2022. This exam offers admission to various courses … Read more
NIFT 2022 admit card has been released on 21st March 2022. NIFT 2022 entrance Exam is conducted for admission to … Read more
NIFT Admit Card: National Institute of Fashion Technology has released admit card for NIFT aspirants on 21st March 2022. Candidates, … Read more